Pathfinding Work on No-Touch Leakage Testing, Part 2: Tales from the Intel I/O Test Road Map - The Engineers' Daughter
With AC I/O Loopback test method Intel, had embarked upon not relying upon Automatic Test Equipment (ATE) to explicitly test for Input/Output (I/O) circuit characteristics. The device under test (DUT) remained connected to ATE and tests like I/O voltage levels and I/O pin leakage were still tested by the ATE. As noted in an earlier post,... Read More